2020   01   az   p.53-57 N.N. Abdulzade, S.Q. Nuriyeva, G.T. Askerkhanova, N.N. Mursakulov,
X-ray diffraction analysis, photoluminescence, and Raman spectra in thin Cu2ZnSnSe4 films obtained by the magnetron sputtering method		  pdf 

ABSTRACT

The article presents an X-ray structural analysis of a thin layer of Cu2ZnSnSe4 obtained on a glass substrate by magnetron sputtering method. It is shown that the layers have an amorphous structure. Thin-layer photoluminescent and Raman spectra were studied using a confocal microspectrometer Nanopinder 30 (Tokyo Instr) (Japan).

Keywords: Confocal Raman Microspectrometer, X-ray structure analysis, modes, photoluminescence, CZTS, optical absorption coefficient, high absorption coefficient, wavelength, forbidden zone width.
PACS: 68.55.Ac 78.40.Fy 81.05.Hd 81.15 Fg

DOI:-

Received: 28.02.2020

AUTHORS & AFFILIATIONS

Institute of Physics named after H.M. Abdullayev, of Azerbaijan National Academy of Sciences, 131, H. Javid ave., Baku, Az-1143, Azerbaijan
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