ABSTRACT
In the present work, thin films containing CuIn5Te8 with a thickness of 300 Å were obtained on various substrates by thermal evaporation of Cu2S and
In2S3 in a ratio of 1:5. The deposition rate of these layers was 15 Å/s, and the substrate temperature (Ts) varied from room temperature
to 500 K.The results of experiments on the formation of solid solutions containing CuIn5-xSnxS8 obtained on the basis of extreme lattices
of the superstructured phase as a result of the presence of the Sn element as an additive in this three-layer compound are presented. It has been established that the
lattice constants of solid solutions formed on the basis of the superstructured phase depend approximately linearly on the concentration of the additive (0.01≤х≤0.09 at.%).
Substitution CuIn5-xSnxS8 reaches its maximum value (0.7Å) in the period of the cubic lattice, stoichiometric composition x=0.07 in solid
solutions.
Keywords: superstructure phase, superlattice, electron diffraction, triple compounds, single crystal layers, elementary core.
PACS: 61.50.ks
DOI:-
Received: 03.03.2023
AUTHORS & AFFILIATIONS
Institute of Physics Ministry of Science and Education Republic of Azerbaijan, 131 H.Javid ave, Baku, AZ-1143, Azerbaijan
E-mail: Uli200909@rambler.ru, cabirismailov@gmail.com
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REFERENCIES
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