OPTICAL PROPERTIES AND FUNCTIONAL APPLICATION PERSPECTIVES OF NANOSCALE Al THIN FILM STRUCTURES
Kh.N. Ahmadova1,2
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ABSTRACT

Nanoscale Al/soda-lime glass (SLG) thin film systems were fabricated using the thermal evaporation technique. Aluminum layers with different thicknesses were deposited onto glass substrates, and Al nanoparticles with an average size of 50 nm were used as the initial material. To determine the optical parameters of the Al/SLG thin films, spectral ellipsometry was applied. Ellipsometry is a highly precise method based on analyzing changes in the polarization state of the reflected light after its interaction with the surface, and it is an effective approach for studying the boundary and surface properties of different media. Measurements were carried out at room temperature within the photon energy range of 0.5–6 eV. The obtained ellipsometric data were analyzed using dispersion models based on Cauchy-type oscillators. Variations in the refractive index were found to be related to the microstructural features of the films, which depend on the partial pressure of oxygen during deposition. The results indicate that such Al/SLG thin film systems can be considered as promising materials for optoelectronic devices, highly sensitive sensors, and various functional electronic components.

Keywords: Spectroscopic Ellipsometry, thin films, refractive index
DOI:10.70784/azip.2.2025338

Received: 06.10.2025
Internet publishing: 09.10.2025    AJP Fizika A 2025 03 az p.38-41

AUTHORS & AFFILIATIONS

1. Institute of Physics Ministry of Science and Education Republic of Azerbaijan, 131 H.Javid ave, Baku, AZ-1073, Azerbaijan
2. Azerbaijan State Oil and Industry University, Baku, AZ-1010, Azerbaijan
E-mail: khuramanahmadova85@gmail.com

Graphics and Images

       

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